O-216 An Overview of Single Event Testing Methods and Analysis
June 2021
Dr. Ernest L. Baker (MSIAC) Single event, go/no-go testing is used for a broad range of applications. Other than the Probit method, these test methods all entail subjecting a sample of items to various stimulus levels, one at a time. The stimulus levels are selected based on experimental parameters and the results of items previously tested. For each test, the outcome is limited to one of two results, either a response or no response.
The stimulus levels are chosen in the region of mixed response, i.e. the stimulus levels that have non-negligible probability of both responding and not responding. It is important to choose the stimulus levels with care. Tests conducted at stimulus levels that have essentially zero probability of responding / not responding contribute little information.
This report provides an overview of the current test and analysis methods that are generally accepted for single event testing.
The stimulus levels are chosen in the region of mixed response, i.e. the stimulus levels that have non-negligible probability of both responding and not responding. It is important to choose the stimulus levels with care. Tests conducted at stimulus levels that have essentially zero probability of responding / not responding contribute little information.
This report provides an overview of the current test and analysis methods that are generally accepted for single event testing.
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